SCANNING ELECTRON MICROSCOPE OPTICS ...

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Sprache: Englisch

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Beschreibung

This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author [...] book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

Details

Erscheinungsjahr:	2010
Fachbereich:	Allgemeines
Genre:	Importe , Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Buch
Inhalt:	Gebunden
ISBN-13:	9789812836670
ISBN-10:	9812836675
Sprache:	Englisch
Einband:	Gebunden
Autor:	Khursheed Anjam
Hersteller:	World Scientific
Verantwortliche Person für die EU:	Libri GmbH, Europaallee 1, D-36244 Bad Hersfeld, gpsr@libri.de
Maße:	235 x 157 x 27 mm
Von/Mit:	Khursheed Anjam
Erscheinungsdatum:	02.11.2010
Gewicht:	0,753 kg