Zum Hauptinhalt springen Zur Suche springen Zur Hauptnavigation springen
Dekorationsartikel gehören nicht zum Leistungsumfang.
Trace-Based Post-Silicon Validation for VLSI Circuits
Buch von Qiang Xu (u. a.)
Sprache: Englisch

95,45 €*

-11 % UVP 106,99 €
inkl. MwSt.

Versandkostenfrei per Post / DHL

Lieferzeit 1-2 Wochen

Produkt Anzahl: Gib den gewünschten Wert ein oder benutze die Schaltflächen um die Anzahl zu erhöhen oder zu reduzieren.
Kategorien:
Beschreibung
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Zusammenfassung

Provides a comprehensive summary of state-of-the-art on post-silicon validation

Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer

Illustrate key concepts and algorithms with real examples

Includes supplementary material: [...]

Inhaltsverzeichnis
Introduction.- State of the Art on Post-Silicon Validation.- Signal Selection for Visibility Enhancement.- Multiplexed Tracing for Design Error.- Tracing for Electrical Error.- Reusing Test Access Mechanisms.- Interconnection Fabric for Flexible Tracing.- Interconnection Fabric for Systematic Tracing.- Conclusion.
Details
Erscheinungsjahr: 2013
Fachbereich: Nachrichtentechnik
Genre: Mathematik, Medizin, Naturwissenschaften, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: xv
108 S.
21 s/w Illustr.
38 farbige Illustr.
108 p. 59 illus.
38 illus. in color.
ISBN-13: 9783319005324
ISBN-10: 3319005324
Sprache: Englisch
Einband: Gebunden
Autor: Xu, Qiang
Liu, Xiao
Hersteller: Springer International Publishing
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 241 x 160 x 11 mm
Von/Mit: Qiang Xu (u. a.)
Erscheinungsdatum: 27.06.2013
Gewicht: 0,36 kg
Artikel-ID: 105901655
Zusammenfassung

Provides a comprehensive summary of state-of-the-art on post-silicon validation

Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer

Illustrate key concepts and algorithms with real examples

Includes supplementary material: [...]

Inhaltsverzeichnis
Introduction.- State of the Art on Post-Silicon Validation.- Signal Selection for Visibility Enhancement.- Multiplexed Tracing for Design Error.- Tracing for Electrical Error.- Reusing Test Access Mechanisms.- Interconnection Fabric for Flexible Tracing.- Interconnection Fabric for Systematic Tracing.- Conclusion.
Details
Erscheinungsjahr: 2013
Fachbereich: Nachrichtentechnik
Genre: Mathematik, Medizin, Naturwissenschaften, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: xv
108 S.
21 s/w Illustr.
38 farbige Illustr.
108 p. 59 illus.
38 illus. in color.
ISBN-13: 9783319005324
ISBN-10: 3319005324
Sprache: Englisch
Einband: Gebunden
Autor: Xu, Qiang
Liu, Xiao
Hersteller: Springer International Publishing
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 241 x 160 x 11 mm
Von/Mit: Qiang Xu (u. a.)
Erscheinungsdatum: 27.06.2013
Gewicht: 0,36 kg
Artikel-ID: 105901655
Sicherheitshinweis